LM LUMEN MAINTENANCE TEST REPORT
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1 Version: B LM LUMEN MAINTENANCE TEST REPORT Company :UNISTARS Corporation Ltd. Sample Name :VENUS 3535 Sample Received :May Sample Tested :Feb TESTING LABORATORY IS ACCREDITED BY: IEC/IECQ certificate of independent test laboratory approval Certificate No.:T1091 ISO accredited in respect of laboratory is approved by TAF Certificate No.:L ISO 9001 certificate is approved by TUV CERT certification body of TUV NORD Cert GmbH EPA-Recognized Laboratories No. : WE HEREBY CERTIFY THAT: The test(s) shown in the attachment were conducted according to the indicating procedures. We assume full responsibility for the accuracy and completeness of these tests and vouch for the qualifications of all personnel performing them. Name Signature Date Test Engineer Max Chen 2013/3/4 Test Manager Allan Tang 2013/3/4 Note: 1. This report will be invalid if reproduced in whole or in part. 2. This report refers only to the specimen(s) submitted to test, and is invalid if used separately. 3. This report is ONLY valid with the examination seal and signature of this institute. 4. The tested specimen(s) will only be preserved for thirty days from the date issued, if not collected by the applicant.
2 Version: B IST LM CERTIFICATION 1. EPA Certificate Laboratory (ENERGY STAR Program) ENERGY STAR website: results New Search Company Name: Integrated Service Technology 2. LED Lighting Facts Approved Testing Laboratory Lighting Facts website: 3. EPA Recognized Lab. Accreditation Body EPA website: 4. ISO Accredited Lab. TAF (EPA approved Accredited Body) website:
3 Reliability & Failure Analysis Engineering Group Page 1 of 18 TABLE OF CONTENTS 1. GENERAL INFORMATION DESCRIPTION OF TEST UNIT SUMMARY OF LM TEST 2.1 SUMMARY TEST RESULT OF LM CHART OF LUMEN MAINTENANCE AND TM-21 PROJECTION CHART OF CHROMATICITY SHIFT LUMEN MAINTENANCE TEST 3.1 TEST EQUIPMENT LABORATORY AMBIENCE CONDITION REFERENCE DOCUMENT TEST CONDITION TEMPERATURE CONTROL METHOD PHOTOGRAPH OF DEVICE TEMPERATURE MEASUREMENT POINT CONTENTS OF TEST TEST DATA TEST DATA TEST DATA... 15
4 Reliability & Failure Analysis Engineering Group Page 2 of GENERAL INFORMATION DESCRIPTION OF TEST UNIT Manufacturer : UNISTARS Corporation Ltd. Model Name : VENUS 3535 Nominal CCT : 3000 K Device Type : LED Package Sample Quantity : See Summary Test Report 2. SUMMARY OF LM TEST 2.1 SUMMARY TEST RESULT OF LM Date(s) Of Performance Of The Test : May,29,2012 ~ Feb,14,2013 LM-80 Nominal Case Temperature (T s ) LM Specified Temperature Customer Selected Test Sample Size (ea) Test Current (I F ) 350mA 350mA 350 ma Actual Case Temperature [T S ] T S Nominal T S Actual Ambient Temperature [T A ] T A Nominal T S Actual Relative Humidity 60 % 60 % 60 % Avg. CCT at 6,000 hours [K] Avg. Chromaticity Shift at 6,000 hours Avg. Lumen Maintenance at 6,000 hours % % %
5 Chromaticity ΔCIE u' v 0 1,000 2,000 3,000 4,000 5,000 6,000 7,000 8,000 9,000 10,000 11,000 12,000 13,000 14,000 15,000 16,000 17,000 18,000 19,000 20,000 21,000 22,000 23,000 24,000 25,000 26,000 27,000 28,000 29,000 30,000 31,000 32,000 33,000 34,000 35,000 36,000 Lumen Maintenance[%] Integrated Service Technology Inc. Reliability & Failure Analysis Engineering Group Page 3 of CHART OF LUMEN MAINTENANCE AND TM-21 PROJECTION 105% T s / TMP LED Lumen Maintenance Projection 100% 95% 90% 85% Projection( ) 85 Projection( ) 55 Projection( ) 45 Test( ) 85 Test( ) 55 Test( ) 45 80% 75% 70% 2.3 CHART OF CHROMATICITY SHIFT T s vs. Chromaticity ΔCIE u' v Ts= 55 Ts= 85 Ts=
6 Reliability & Failure Analysis Engineering Group Page 4 of LUMEN MAINTENANCE TEST 3.1 TEST EQUIPMENT Test Equipment Model Name Serial Number Calibration Trace Code LM-80 Test System Vektrex Spike Safe N/A LM-80 Chamber Integrating Sphere Vektrex ITCS Labsphere CY CSTM-LMS A CLTS A N/A Power Supply KEITHLEY A LABORATORY AMBIENCE CONDITION Item Temperature Relative Humidity Laboratory Chamber Area 25 ± 5 C 55 %RH ± 10 % Laboratory Photometry Area 25 ± 2 C 55 %RH ± 10 % 3.3 REFERENCE DOCUMENT This test refer to IES-LM Test Method 3.4 TEST CONDITION Test Temperature : 45 / 55 / 85 Actual Ta/Ts Temperature Driver Current Relative Humidity Air Flow Lumen Monitoring Interval Photometric measurement uncertainty : See Individual Test Report : Constant DC 350mA : 60%RH : 1 m/sec : 0/1000/2000/3000/4000/5000/6000 hours. : Calculated to k = 2 coverage (i.e. 95% coverage) Item Uncertainty Luminous Flux (FV) 0.681% Correlated Color Temperature (CCT) 0.156%
7 Reliability & Failure Analysis Engineering Group Page 5 of TEMPERATURE CONTROL METHOD 3.6 PHOTOGRAPH OF DEVICE Device Outline Drawing
8 Reliability & Failure Analysis Engineering Group Page 6 of TEMPERATURE MEASUREMENT POINT Ta (Measured Point Of T A =Ambient Temperature) Ta is the temperature of the air at a distance of 5 mm above the reliability test board. (Measured Point Of T S =Case Temperature)
9 Chromaticity CIE Δu' v' Lumen Maintenmance Integrated Service Technology Inc. Reliability & Failure Analysis Engineering Group Page 7 of CONTENTS OF TEST LUMEN MAINTENANCE AND CHROMATICITY SHIFT Actual Case Temperature [T S ] 45.3 Actual Ambient Temperature [T A ] 44.4 Test Current (I F ) : 350mA Relative Humidity : 60 %RH Air Flow : 1 m/sec % T s vs. Lumen Maintenance % 95.00% 90.00% 85.00% Nominal Ts= % 75.00% 70.00% T s vs. Chromaticity CIE Δu' v' Nominal Ts=
10 Reliability & Failure Analysis Engineering Group Page 8 of Luminous Maintenance (%) and Forward Voltage (Vf) No. 0Hr. [Vf] 0Hr. [Lumen] 0Hr. 1,000Hrs. 2,000Hrs. 3,000Hrs. 4,000Hrs. 5,000Hrs. 6,000Hrs % % % 99.78% 99.79% 99.59% % % % 99.90% 99.58% 99.59% 99.27% % % % % % % 99.81% % % % % 99.97% 99.98% 99.80% % % % % % % % % % % % % % % % % 99.94% % 99.72% 99.80% 99.78% % % % % % % % % % % % % % % % % % % % % % % % % % % % % % % % % % % % % % % % % % 99.82% % % % % % % 99.77% % % % % % % % % % % % % % 99.79% % % % % 99.59% 99.75% 99.75% % % % % % % % % % % % 99.51% 99.77% 99.60% % % % % % % % % Avg % % % % % % % Min % 99.94% 99.90% 99.51% 99.59% 99.27% % Max % % % % % % % Med % % % % % 99.95% % St. Dev
11 Reliability & Failure Analysis Engineering Group Page 9 of CIEx CIEy,CCT and Chromaticity Shift (Δu v ) CIE u' v' 0Hr. 1,000Hrs. 2,000Hrs. 3,000Hrs. 4,000Hrs. 5,000Hrs. 6,000Hrs. No. CIE x CIE y CCT [K] ΔCIE u'v' ΔCIE u'v' ΔCIE u'v' ΔCIE u'v' ΔCIE u'v' ΔCIE u'v' ΔCIE u'v' Avg Min Max Med St. Dev
12 0 1,000 2,000 3,000 4,000 5,000 6,000 7,000 8,000 9,000 10,000 11,000 12,000 13,000 14,000 15,000 16,000 17,000 18,000 19,000 20,000 21,000 22,000 23,000 24,000 25,000 26,000 27,000 28,000 29,000 30,000 31,000 32,000 33,000 34,000 35,000 36,000 Lumen Maintenance[%] Integrated Service Technology Inc. Reliability & Failure Analysis Engineering Group Page 10 of TM-21 Projection 105% T s / TMP LED Lumen Maintenance Projection 100% 95% Projection( ) 45 Test( ) 45 90% 85% 80% 75% 70% EPA Method Slope(m) E-09 Intercept(b) 2.941E-03 α E-09 B Calculated L 70 (6k) 49,578,000 Reported L 70 (6k) >36,000
13 Chromaticity CIE Δu' v' Lumen Maintenmance Integrated Service Technology Inc. Reliability & Failure Analysis Engineering Group Page 11 of LUMEN MAINTENANCE AND CHROMATICITY SHIFT Actual Case Temperature [T S ] 56.2 Actual Ambient Temperature [T A ] 54.2 Test Current (I F ) : 350mA Relative Humidity : 60 %RH Air Flow : 1 m/sec % T s vs. Lumen Maintenance % 95.00% 90.00% 85.00% Nominal Ts= % 75.00% 70.00% T s vs. Chromaticity CIE Δu' v' Nominal Ts=
14 Reliability & Failure Analysis Engineering Group Page 12 of Luminous Maintenance (%) and Forward Voltage (Vf) No. 0Hr. [Vf] 0Hr. [Lumen] 0Hr. 1,000Hrs. 2,000Hrs. 3,000Hrs. 4,000Hrs. 5,000Hrs. 6,000Hrs % % % 99.81% 99.33% 98.61% 98.64% % % % 99.89% 99.93% 99.67% % % % % % % 99.63% % % % % % 99.97% 99.77% 99.59% % % % % % % 99.44% % % 99.91% 99.76% 99.71% 99.57% 99.82% % % % % % % 99.35% % % % % % % % % % % % % 99.99% % % % % % % % % % % % % % % % % % % 99.91% 99.79% 99.46% 99.21% % % % 99.76% 99.75% 99.52% 99.55% % % 99.90% 99.75% 99.78% 99.55% 99.79% % % % 99.97% % 99.82% % % % % % % % 99.92% % % % % % % % % % % % % 99.95% % % % % % % % % % % % 99.69% 99.84% 99.75% % Avg % % % % % 99.99% 99.95% Min % % 99.90% 99.69% 99.33% 98.61% 98.64% Max % % % % % % % Med % % % % % 99.88% % St. Dev
15 Reliability & Failure Analysis Engineering Group Page 13 of CIEx CIEy,CCT and Chromaticity Shift (Δu v ) CIE u' v' 0Hr. 1,000Hrs. 2,000Hrs. 3,000Hrs. 4,000Hrs. 5,000Hrs. 6,000Hrs. No. CIE x CIE y CCT [K] ΔCIE u'v' ΔCIE u'v' ΔCIE u'v' ΔCIE u'v' ΔCIE u'v' ΔCIE u'v' ΔCIE u'v' Avg Min Max Med St. Dev
16 0 1,000 2,000 3,000 4,000 5,000 6,000 7,000 8,000 9,000 10,000 11,000 12,000 13,000 14,000 15,000 16,000 17,000 18,000 19,000 20,000 21,000 22,000 23,000 24,000 25,000 26,000 27,000 28,000 29,000 30,000 31,000 32,000 33,000 34,000 35,000 36,000 Lumen Maintenance[%] Integrated Service Technology Inc. Reliability & Failure Analysis Engineering Group Page 14 of TM-21 Projection 105% T s / TMP LED Lumen Maintenance Projection 100% 95% Projection( ) 55 Test( ) 55 90% 85% 80% 75% 70% EPA Method Slope(m) E-06 Intercept(b) 9.168E-03 α E-06 B Calculated L 70 (6k) 214,000 Reported L 70 (6k) >36,000
17 Chromaticity CIE Δu' v' Lumen Maintenmance Integrated Service Technology Inc. Reliability & Failure Analysis Engineering Group Page 15 of LUMEN MAINTENANCE AND CHROMATICITY SHIFT Actual Case Temperature [T S ] 85.6 Actual Ambient Temperature [T A ] 83.5 Test Current (I F ) : 350mA Relative Humidity : 60 %RH Air Flow : 1 m/sec % T s vs. Lumen Maintenance % 95.00% 90.00% 85.00% Nominal Ts= % 75.00% 70.00% T s vs. Chromaticity CIE Δu' v' Nominal Ts=
18 Reliability & Failure Analysis Engineering Group Page 16 of Luminous Maintenance (%) and Forward Voltage (Vf) No. 0Hr. [Vf] 0Hr. [Lumen] 0Hr. 1,000Hrs. 2,000Hrs. 3,000Hrs. 4,000Hrs. 5,000Hrs. 6,000Hrs % % 99.33% 98.58% 98.11% 97.46% 96.63% % % 99.39% 98.61% 97.60% 96.49% 95.17% % 99.99% 99.12% 98.43% 97.88% 97.08% 96.33% % 99.83% 98.88% 97.73% 97.09% 96.29% 95.06% % 99.63% 98.84% 98.28% 98.14% 97.75% 97.22% % 99.60% 98.73% 97.79% 97.03% 96.15% 94.89% % 99.74% 99.30% 98.93% 99.03% 98.93% 98.28% % % 99.51% 99.17% 99.14% 99.22% 98.99% % % 99.40% 98.61% 98.16% 97.57% 96.43% % 99.77% 98.83% 97.86% 97.37% 96.70% 95.35% % 99.45% 98.37% 97.40% 96.84% 96.17% 94.75% % 99.78% 99.29% 98.64% 98.39% 98.19% 97.49% % % 99.52% 98.89% 98.55% 98.35% 97.75% % 99.87% 99.14% 98.28% 97.71% 97.07% 95.77% % 99.78% 98.92% 98.14% 97.58% 96.99% 95.66% % 99.82% 98.98% 98.04% 97.51% 96.75% 95.49% % 99.90% 99.30% 98.46% 98.02% 97.31% 96.02% % % 99.25% 98.28% 97.67% 96.60% 95.50% % 99.55% 98.83% 97.59% 97.02% 96.08% 94.79% % 99.47% 98.61% 97.50% 97.09% 96.36% 95.24% Avg % 99.82% 99.08% 98.26% 97.80% 97.18% 96.14% Min % 99.45% 98.37% 97.40% 96.84% 96.08% 94.75% Max % % 99.52% 99.17% 99.14% 99.22% 98.99% Med % 99.82% 99.13% 98.28% 97.69% 97.03% 95.71% St. Dev
19 Reliability & Failure Analysis Engineering Group Page 17 of CIEx CIEy,CCT and Chromaticity Shift (Δu v ) CIE u' v' 0Hr. 1,000Hrs. 2,000Hrs. 3,000Hrs. 4,000Hrs. 5,000Hrs. 6,000Hrs. No. CIE x CIE y CCT [K] ΔCIE u'v' ΔCIE u'v' ΔCIE u'v' ΔCIE u'v' ΔCIE u'v' ΔCIE u'v' ΔCIE u'v' Avg Min Max Med St. Dev
20 0 1,000 2,000 3,000 4,000 5,000 6,000 7,000 8,000 9,000 10,000 11,000 12,000 13,000 14,000 15,000 16,000 17,000 18,000 19,000 20,000 21,000 22,000 23,000 24,000 25,000 26,000 27,000 28,000 29,000 30,000 31,000 32,000 33,000 34,000 35,000 36,000 Lumen Maintenance[%] Integrated Service Technology Inc. Reliability & Failure Analysis Engineering Group Page 18 of TM-21 Projection 105% T s / TMP LED Lumen Maintenance Projection 100% 95% Projection( ) 85 Test( ) 85 90% 85% 80% 75% 70% EPA Method Slope(m) E-06 Intercept(b) 5.258E-03 α E-06 B Calculated L 70 (6k) 51,000 Reported L 70 (6k) >36,000
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