This educational seminar discusses creating, measuring, and troubleshooting Ultra-High Vacuum ( Torr) systems.

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This educational seminar discusses creating, measuring, and troubleshooting UltraHigh Vacuum ( 10 8 10 12 Torr) systems. Specifically, today s talk will cover: Brief review of High Vacuum (Characteristics, Pumps & Gauges) Applications requiring UltraHigh Vacuum UltraHigh Vacuum Gauges CryoPumps & UHV Pumps (detailed description of Diode & Noble Diode Sputter Ion Pumps) Challenges in achieving UHV Pressures

This educational seminar discusses creating, measuring, and troubleshooting UltraHigh Vacuum ( 10 8 10 12 Torr) systems. Specifically, today s talk will cover: Brief review of High Vacuum (Characteristics, Pumps & Gauges) Applications requiring UltraHigh Vacuum UltraHigh Vacuum Gauges CryoPumps & UHV Pumps (detailed description of Diode & Noble Diode Sputter Ion Pumps) Challenges in achieving UHV Pressures Previous Webinars (Vacuum Fundamentals, Rough Vacuum, High Vacuum) are available for download at: http://www.agilent.com/enus/trainingevents/eseminars/vacuum

High Vacuum Review: Characteristics Particles are moving in Molecular Flow Long Mean Free Path (MFP) Few collisions with other molecules Large pump inlets (high conductance) key to achieving efficient pumping Gas Composition is constant through High Vacuum (80% H 2 O, 10% N 2, 10% CO)

High Vacuum Review: Characteristics Particles are moving in Molecular Flow Long Mean Free Path (MFP) Few collisions with other molecules Large pump inlets (high conductance) key to achieving efficient pumping Gas Composition is constant through High Vacuum (80% H 2 O, 10% N 2, 10% CO) Chamber Volume is NOT the dominant factor governing pumpdown time Surface Area, Material Type and Pump Speed determine ultimate pressure Pressure (Torr) 10 3 10 0 10 3 10 6 Volume Pressure Decay Desorption Diffusion 10 9 Time

High Vacuum Review: Pumps and Gauges Two types High Vacuum Pumps: Capture pumps (CryoPump) Displacement pumps (TurboPump & Diffusion Pump) No High Vacuum Pumps can compress gas to Atmosphere!

High Vacuum Review: Pumps and Gauges Two types High Vacuum Pumps: Capture pumps (CryoPump) Displacement pumps (TurboPump & Diffusion Pump) No High Vacuum Pumps can compress gas to Atmosphere! IONIZATION GAUGES used to measure High Vacuum pressures Hot Ionization Gauge (BA) Cold Cathode & IMG Gauges Wide Range gauges use multiple technologies in a single housing (e.g. IMG & Pirani).

UHV Applications 760 Torr 25 Torr 7.5 e4 Torr 7.5 e7 Torr 7.5 e10 Torr 7.5 e12 Torr Pickup & Conveyance Food Packaging Freeze Drying Incandescent Lamps Heat Treatment Surface Coating Thin Film Deposition Semiconductors Electron Mass Microscopy Spectrometry Nanotechnology SubAtomic Research Space Research

Vacuum Measurement Technologies Different technologies are required to measure the vacuum pressure in different vacuum regions RANGE GAUGE TYPE EXAMPLES Rough Vacuum Atm 10 3 Mechanical Deflection & Thermal Transfer Gauges Bourdon Gauge Capacitance Manometer Thermocouple, Convection, Pirani High Vacuum Ultra High Vacuum 10 3 10 9 Mechanical Deflection & Ionization Gauges < 10 10 Ionization Gauges & Gas Analyzers Capacitance Manometer Hot Filament Gauge (BA) IMG / Penning Gauge UHV Ionization Gauges Residual Gas Analyzer (RGA) Ion Pump Current https://cds.cern.ch/record/455555/files/p75.pdf

UltraHigh Vacuum Gauges UltraHigh Vacuum High Vacuum Rough Vacuum Bourdon Gauge Capacitance Manometer Thermocouple Gauge Pirani Gauge Hot Fil. Ion Gauge IMG / Penning Gauge Residual Gas Analyzer Spinning Rotor Gauge 10 12 10 10 10 8 10 6 10 4 10 2 1 10 2 Pressure (Torr) Confidentiality Label April 3, 2017 6

Modified Hot Filament Ion Gauge How it Works: Overcome Glass Permeation and Xray Limit (measurement inaccuracy caused by Xrays striking central filament) No Glass Envelope eliminate permeation leak through glass Smaller Structures reduce measurement error caused by Xrays Allmetal Seals eliminate permeation through oring Accuracy: ± 20% of full scale within a pressure decade Can read to 5 x 10 12 Torr vs 3 x 10 10 Torr for Glass Envelope BA e electron neutral gas atom Electrons Collide with Neutral Atoms or Molecules Controller Filament e e e Ion Collector e Grid Gas Relative Sensitivity Ar 1.2 CO 1.0 1.1 H 2 0.40 0.55 He 0.16 H 2 0 0.9 1.0 N 2 1.00 Ne 0.25 O 2 0.8 0.9 Confidentiality Label April 3, 2017 7

Inverted Magnetron Gauge How it Works: Anode is a rod in the axis of an almost closed cylinder (Cathode) End discs of the of the cathode are shielded guard rings Prevents field emission affecting ion current measurement Anode at ~4 kv vs 2 kv for Magnetron and is parallel to the gauge s magnetic field. Superior starting characteristics (vs Cold Cathode Gauge) Stable Pressure reading and Fast Response 10 3 to 10 11 Torr Operating Range Accuracy: ± 50% within a pressure decade

High Vacuum Pumps: Operating Range UltraHigh Vacuum High Vacuum Rough Vacuum Turbo Pump Drag Pump Vapor Jet Pump Cryo Pump LN 2 Trap 10 12 10 10 10 8 10 6 10 4 10 2 1 10 2 P (Torr) Confidentiality Label April 3, 2017 9

High Vacuum Pumps: Operating Range UltraHigh Vacuum High Vacuum Rough Vacuum Turbo Pump Drag Pump Vapor Jet Pump Cryo Pump LN 2 Trap 10 12 10 10 10 8 10 6 10 4 10 2 1 10 2 P (Torr) Confidentiality Label April 3, 2017 10

Cryogenic Pump Operation: UHV All CryoPumps require REGENERATION when Cold Heads become saturated (drop in pumping speed/increase in 2 nd stage temperature) Confidentiality Label April 3, 2017 11

PASSIVE Cryogenic Trap (w/ Valve) Confidentiality Label April 3, 2017 12

UHV Pumps Confidentiality Label April 3, 2017 13

UHV Pump Operating Ranges Ultra High Vacuum High Vacuum Pump High Vacuum Roughing Pumps Rough Vacuum Sputter Ion Pump Titanium Sublimation Pump Non Evaporable Getter 10 12 10 10 10 8 10 6 10 4 10 2 1 10 2 P (Torr) Confidentiality Label April 3, 2017 14

Sputter Ion Pump: Anatomy of a Diode Element

Titanium Cathode Sputter Ion Pump: Anatomy of a Diode Element Single Cell Diode Pump Element Stainless Steel Anode Anode Cross Section https://cds.cern.ch/record/454179/files/p37.pdf

Crosssection of a Diode Cell X = Magnetic Field INTO the Page

Voltage Potential Creates Plasma (Free Electrons!) e X = Magnetic Field INTO the Page

Electrons Accelerated by Magnetic Field e M Resulting in Formation of POSITIVE Ions

Ions Accelerated by Electric Field M What Happens Next Depends on Which IONS are Formed

Lighter Ions are Accelerated Towards the Cathodes He & H 2

. and Driven Into Cathode Material (Titanium) He & H 2 Permanently Trapping Them in the Cathode Structure

Larger Molecules Driven into Cathodes Larger Molecules

Sputtering TITANIUM Onto Anode Surface

Getterable Gas Species React with Sputtered Titanium TiO Forming Stable Compounds

PROBLEM: Noble Gases are NonReactive April 3, 2017 Confidentiality Label 25 1 H 1.008 3 Li 6.94 4 Be 9.0122 11 Na 22.990 12 Mg 24.305 19 K 39.10 20 Ca 40.08 37 Rb 85.467 38 Sr 87.62 55 Cs 132.91 56 Ba 137.3 87 Fr 88 Ra 226.03 2 He 4.0026 7 N 14.007 8 O 15.999 9 F 18.998 10 Ne 20.17 6 C 12.11 5 B 10.81 14 Si 28.08 15 P 30.974 16 S 32.06 17 Cl 35.453 18 39.94 Ar 13 Al 26.982 33 As 74.922 34 Se 78.9 35 Br 79.904 36 Kr 83.8 32 Ge 72.5 31 Ga 69.72 50 Sn 118.6 51 Sb 121.7 52 Te 127.6 53 I 126.90 54 131.30 Xe 49 In 114.82 26 Fe 54.938 27 Co 55.84 28 Ni 58.7 29 Cu 63.54 30 65.3 Zn 25 Mn 51.996 45 Rh 102.91 46 Pd 106.4 47 Ag 107.87 48 Cd 112.4 44 Ru 101.0 43 Tc 98.906 76 Os 190.3 77 Ir 192.3 78 Pt 195.0 79 Au 196.97 80 200.5 Hg 75 Re 186.2 82 Pb 207.2 83 Bi 208.98 84 Po 85 At 86 Rn 81 Tl 204.3 22 Ti 47.9 23 V 50.941 24 Cr 50.996 21 Sc 44.956 41 Nb 92.906 42 Mo 95.9 40 Zr 91.22 39 Y 10.81 72 Hf 178.4 73 Ta 180.95 74 W 183.8 57 71 La SERIES 89 103 Ac SERIES 69 Tm 168.93 70 Yb 173.0 71 Lu 174.97 68 Er 167.2 67 Ho 164.93 100 Fm 101 Md 102 No 103 Lr 99 Es 62 Sm 150.4 63 Eu 151.96 64 Gd 157.2 65 Tb 158.92 66 162.5 Dy 61 Pm 95 Am 96 Cm 97 Bk 98 Cf 94 Pu 93 Np 237.05 58 Ce 140.12 59 Pr 140.91 60 Nd 144.2 57 La 138.91 91 Pa 231.04 92 U 238.03 90 Th 232.04 89 Ac La Series Ac Series

NOBLE Gas Ions Accelerate Towards the Cathodes Ne Ar Kr Xe

but are NOT Permanently Trapped in Cathodes Ne Ar Kr Xe

but are NOT Permanently Trapped in Cathodes Larger Molecules

but are NOT Permanently Trapped in Cathodes

and are Liberated as TITANIUM is Removed Ne Ar Kr Xe NOBLE Gases are NOT Permanently Trapped in the DIODE PUMP s Titanium Cathode Structure

Diode Pump: Best AllRound UHV Pump DIODE (2x Ti Cathodes) Highest Pumping Speed & Capacity for Hydrogen (2x Flat Titanium Cathodes) Highest Pumping Speed for Chemically Reactive ( Getterable ) Gases (CO, CO 2, H 2, N 2, O 2 etc) Not Recommended for pumping noble gases Argon instability after ~ 20 h at 10 6 Torr 22 Ti (47.9) Diode Cathode & Anode

NOBLE DIODE: Solving Argon Instability Problem NOBLE DIODE (1x Ti, 1x Ta Cathodes) Tantalum cathode reflects NEUTRALS with High Energy (ie. have greater ability to penetrate Titanium on Anode Surface) Reduced H 2 Pumping Speed (1x Titanium Cathode & 1x Tantalum Cathodes) through entrapment Reduced Pumping Speed for ALL Getterable Gases (less Titanium available to be sputtered) 22 Ti (47.9) 73 Ta (180.95) Noble Diode Cathode (Ti Plate) & Anode

How it Works: Noble Diode Pump TANTALUM is more dense than Ti H 2

How it Works: Noble Diode Pump TANTALUM is more dense than Ti H 2 Ions are Neutralized and Reflected by the TANTALUM Cathode with HIGH ENERGY H 2 They become reionized in the Electron Cloud (not shown) and are driven towards the TITANIUM Cathode

SOLUTION: Noble Diode Pump Uses 1x Tantalum Cathode H 2 Lighter Gases are Again Permanently Trapped in the Titanium Cathode Structure

Larger Molecules Driven into TITANIUM Cathode Larger Molecules

Sputtering (LESS!) TITANIUM Onto Anode Surface

Ions Striking Ta Cathode Reflected as High Engergy Neutrals Larger Molecules With enough energy to penetrate the TITANIUM coating on the Anode: Since no sputtering occurs at the Anode, they are permanently trapped (and coated with fresh Ti after)

Getterable Gas Species React with Sputtered Titanium TiO Forming Stable Compounds

NOBLE Gas Ions Accelerate Towards the Cathodes Ne Ar Kr Xe

and are again lightly buried in the TITANIUM Cathode Ne Ar Kr Xe

and are again lightly buried in the TITANIUM Cathode Ne Ar Kr Xe but they are REFLECTED as High Energy Neutrals off the TANTALUM Cathode (Can penetrate the Titanium layer on the Anode Surface)

NOBLE Gas Molecules Can Be Covered by Sputtered Titanium Ne Ar Kr Xe Effectively Trapping Them on the Anode Surface

NOBLE Gas Molecules Can Be Covered by Sputtered Titanium Ne Ar Kr Xe Unlike NOBLE Gas Ions on the TITANIUM Cathode (that are again released by subsequent bombardments)

Triode Pumps (inc. StarCell) Use Modified Cathode Geometry

Alternate Cathode Designs Fore Specific Gases TRIODE Anode is grounded; Cathode consists of STRIPS of TITANIUM at Negative voltage Noble gas ions have glancing collisions with Cathodes and then become high energy neutrals Neutrals resting (even briefly) on the Anode and Pump wall can be covered up by freshly sputtered Titanium No sputtering occurs on the pump walls or at the Anode so Noble gas pumping is stable Chemically active gases are also pumped on the walls and Anode (Hydrogen is Gettered and diffused into cathode structure)

StarCell Design: The Ultimate Triode Pump! STAR CELL Optimized Triode Design: Star shaped cutouts in TITANIUM Cathode provide maximum pumping speed for Noble Gases optimized lifetime vs Diode Pump (80K hours vs. 50K hours) ~20 times longer Argon stability than Noble Diode Pumping speed for Getterable gases and Hydrogen comparable to Noble Diode Pump Higher Hydrogen capacity than Noble Diode

Ion Pump Controller ION PUMP CONTROLLER Precision power supplies (80 200 W) required for each Ion Pump Agilent Ion Pump controller software ramps voltage to ignite plasma Current (between Cathode and Anode) can be measured to indicate the Vacuum Pressure ( Cold Cathode ) Step Voltage feature optimizes sputtering of Titanium Voltage reduced after ignition (reducing Leakage Current) which allows pressures in 10 10 Torr range to be measured

Using ION PUMP Current as UHV Gauge ION PUMP CURRENT Current in an ion pump is linearly proportional to the pressure so the ion pump can be used to roughly read the pressure Limitation at low pressure is given by the leakage current (roughly Ion Current Potential)

Getter Pumps: Pumping without Sputtering There Are Two Ways of Producing a Clean Gettering Surface: NonEvaporable Getters NEG: by heating an oxidized getter (i.e. powder coated metallic strip) to a temperature high enough to diffuse oxygen from the surface into the getter bulk. Evaporable Getters TSP: the active surface is obtained by "in situ" deposition under vacuum of a fresh clean metallic film Confidentiality Label April 3, 2017 47

Titanium Sublimation Pumps Ti Ball Heater Mini TiBall Source TiBall Source (35 grams) Mini TiBall Source (15 grams) 3 Filaments Titanium Filaments (4 1/2 grams) Confidentiality Label April 3, 2017 48

Ion Pump Selection Criteria TSP Triode Star Cell Diode Noble Diode Hydrogen 3 1 2 3 1 Helium 0 3 4 1 3 Water 3 2 2 3 2 Methane 0 3 3 2 3 Nitrogen 3 2 2 3 3 O 2, CO, CO 2 4 2 2 3 3 Argon 0 3 4 1 3 Null 0 Poor 1 Good 2 Excellent 3 Outstanding 4 Combination Star Cell TSP is best combination for a wide variety of gases Diode pump has optimum pumping speed for Hydrogen

UHV System Schematic UHV Chamber Roughing Valve UHV Gauge Foreline Valve Scroll (Rough) Pump Turbo (HV) Pump HiVac Valves Ion & TSP (UHV) Pumps Confidentiality Label April 3, 2017 50

UHV System Operation UHV Chamber 10 2 10 6 Torr Roughing Valve UHV Gauge Foreline Valve Scroll (Rough) Pump Turbo (HV) Pump HiVac Valves Ion & TSP (UHV) Pumps Confidentiality Label April 3, 2017 51

UHV System Operation UHV Chamber 10 6 10 9 Torr Roughing Valve UHV Gauge Foreline Valve Scroll (Rough) Pump Turbo (HV) Pump HiVac Valves Ion & TSP (UHV) Pumps Confidentiality Label April 3, 2017 52

UHV System Operation UHV Chamber < 10 9 Torr Roughing Valve UHV Gauge Foreline Valve Scroll (Rough) Pump Turbo (HV) Pump HiVac Valves Ion & TSP (UHV) Pumps Confidentiality Label April 3, 2017 53

Troubleshooting UltraHigh Vacuum Systems Permeation Real Desorption Leaks Outgassing (H 2 O, Solvents) Permeation Surface (He, H 2 Conditions ) & Trapped Diffusion Volumes: Materials: Leaks: Internal Leaks Virtual Leaks Virtual Leaks Process Real Leaks Diffusion (H 2 ) Backstreaming (Oil, He) S D Confidentiality Label April 3, 2017 54

Troubleshooting UltraHigh Vacuum Systems Permeation Real Desorption Leaks Outgassing (H 2 O, Solvents) Permeation Surface (He, H 2 Conditions ) & Trapped Diffusion Volumes: Materials: Leaks: Virtual Leaks Virtual Leaks Real Leaks Diffusion (H 2 ) Backstreaming (Oil, He) S D Confidentiality Label April 3, 2017 54

Troubleshooting UltraHigh Vacuum Systems Permeation Real Desorption Leaks Outgassing (H 2 O, Solvents) Permeation Surface (He, H 2 Conditions ) & Trapped Diffusion Volumes: Materials: Leaks: Virtual Leaks Virtual Leaks Diffusion (H 2 ) Backstreaming (Oil, He) S D Confidentiality Label April 3, 2017 54

Troubleshooting UltraHigh Vacuum Systems Permeation Real Desorption Leaks Permeation Surface (He, H 2 Conditions ) & Trapped Diffusion Volumes: Materials: Leaks: Outgassing (H 2 O, Solvents) Diffusion (H 2 ) Backstreaming (Oil, He) S D Confidentiality Label April 3, 2017 54

Troubleshooting UltraHigh Vacuum Systems Permeation Real Leaks Permeation Surface (He, H 2 Conditions ) & Trapped Diffusion Volumes: Materials: Leaks: Outgassing (H 2 O, Solvents) Diffusion (H 2 ) Backstreaming (Oil, He) S D Confidentiality Label April 3, 2017 54

Troubleshooting UltraHigh Vacuum Systems Permeation Real Leaks Permeation Surface (He, H 2 Conditions ) & Trapped Volumes: Materials: Leaks: Outgassing (H 2 O, Solvents) Diffusion (H 2 ) Backstreaming (Oil, He) S D Confidentiality Label April 3, 2017 54

Troubleshooting UltraHigh Vacuum Systems Permeation Real Leaks Permeation Surface (He, H 2 Conditions ) & Trapped Volumes: Materials: Leaks: Outgassing (H 2 O, Solvents) Diffusion (H 2 ) Back Backstreaming (Oil, He) streaming S D Confidentiality Label April 3, 2017 54

Locating REAL Leaks Helium Mass Spec Leak Detection (HMSLD) is a very sensitive technique typically used to locate REAL ( outsidein ) leaks in UHV Systems. Theory of Operation Mass Spectrometer tuned to detect only Helium Why we use Helium? Highly mobile, inert, (relatively) available & inexpensive, low surface absorption (easy to pump away) present in air in low quantity ( 5 ppm)

Locating REAL Leaks Helium Mass Spec Leak Detection (HMSLD) is a very sensitive technique typically used to locate REAL ( outsidein ) leaks in UHV Systems. Theory of Operation Mass Spectrometer tuned to detect only Helium Why we use Helium? Highly mobile, inert, (relatively) available & inexpensive, low surface absorption (easy to pump away) present in air in low quantity ( 5 ppm) Ion Source Gas Flow Magneti c Field x x x x x x x x x x x x x x x x x x x x x x x x x x Detector

Eliminating VIRTUAL Leaks: Desorption & Diffusion Desorption & Diffusion Minimize the amount of moisture entering the vacuum system, and accelerate the rate of Desorption and Diffusion of gases that ARE in the system Keep vacuum system interior CLEAN and free of moisture When necessary, vent chamber with inert gas Minimize exposure of clean parts to air Choose materials with high bakeout temperatures EFFECTIVENESS OF BAKEOUT IS LINEAR WITH TIME BUT EXPONENTIAL WITH TEMPERATURE Confidentiality Label April 3, 2017 56

Pressure (mbar) Bake Out Example First Bake Was Done With No Insulation and Uneven Heating Second Bake Used Insulation to Improve Heating 75 L/s Rate of Rise Test 1.00E06 1.00E07 1.00E08 Second bake First bake 1.00E09 1.00E10 0 100 200 300 400 Time (sec) Confidentiality Label April 3, 2017 57

Materials Selection for UHV Choose UHV Vacuum System materials based on: 1. Vacuum Compatibility Outgassing Rates (available online; temp & surface finish specific) Permeation Rates (available online for metals and elastomers) BakeOut Temperature (critical in achieving UHV pressures!) 2. Mechanical Properties Physical Strength Conductivity Radiation

Typical Cleaning Material Procedure 1 10 2 Wash in hot water with detergent Use ultrasonic bath if available 10 4 10 6 Rinse with hot demineralized water and dry 10 8 10 10 10 12 Ultrasonic wash in hot solvent Vapour wash in solvent vapour Rinse with hot demineralized water Vacuum bake at 200 C Confidentiality Label April 3, 2017 59

Some Typical Chemical Cleaning Agents (CERN) Agent Examples Advantages Disadvantages Disposal Water Cheap; readily available Need to use demineralised for cleanliness. Not a strong solvent To foul drain. Alcohols Ethanol, methanol, isopropanol Relatively cheap, readily available, quite good solvents. Need control affect workers, some poisonous, some flammable, stringent safety precautions. Evaporate or controlled disposal. Organic solvents Acetone, ether, benzene Good solvents, evaporate easily with low residue. Either highly flammable or carcinogenic. Usually evaporate! Detergents Aqueous solutions, non toxic, cheap and readily available, moderate solvents. Require careful washing and drying of components. Can leave residues. To foul drain after dilution. Alkaline degreasers Almeco, sodium hydroxide Aqueous solutions, non toxic, moderate solvents. Can leave residues and may deposit particulate precipitates. Requires neutralisation, then dilution to foul drain. Citric acid Citrinox Cheap and readily available, quite good solvents. Require careful washing and drying of components. Can leave residues. Unpleasant smell. To foul drain after dilution Confidentiality Label April 3, 2017 60

Possible Sources of Leaks in UHV Virtual Leaks Residual solvents (following maintenance cleaning) Liquid leaks such as cooling fluids Trapped volumes of Gas or Liquid Trapped space under nonvented hardware UHV UHV Gasses or solvents in spaces With Poor Conductance High Vapor Pressure materials Porous materials exposed to liquid or atmosphere

Possible Sources of Leaks in UHV Virtual Leaks Residual solvents (following maintenance cleaning) Liquid leaks such as cooling fluids Trapped volumes of Gas or Liquid Trapped space under nonvented hardware Permeation Leaks All metal seals (minimize use of O ring seals where practical) Use less porous materials Insulating Vacuum UHV UHV Gasses or solvents in spaces With Poor Conductance High Vapor Pressure materials Porous materials exposed to liquid or atmosphere

Possible Sources of Leaks in UHV Virtual Leaks Residual solvents (following maintenance cleaning) Liquid leaks such as cooling fluids Trapped volumes of Gas or Liquid Trapped space under nonvented hardware Permeation Leaks All metal seals (minimize use of O ring seals where practical) Use less porous materials Insulating Vacuum UHV UHV Gasses or solvents in spaces With Poor Conductance High Vapor Pressure materials Porous materials exposed to liquid or atmosphere

Reducing Backstreaming Through Compression: XHV Outgassing (H 2 O, Solvents) Diffusion (H 2 ) Backstreaming (Oil, He) S D Extra DECADES of Compression (virtually) Eliminate Backstreaming and should allow pressures into 10 10 Torr Range with appropriate Baking and Material selection S D Confidentiality L April 3, 2 62

Summary: UltraHigh Vacuum

Summary: UltraHigh Vacuum Molecular Flow requires pumps with high conductance inlets mounted as close as possible to the vacuum system

Summary: UltraHigh Vacuum Molecular Flow requires pumps with high conductance inlets mounted as close as possible to the vacuum system Modified Ionization Vacuum Gauges are most suitable for UltraHigh Vacuum; Gauges are gas type dependent

Summary: UltraHigh Vacuum Molecular Flow requires pumps with high conductance inlets mounted as close as possible to the vacuum system Modified Ionization Vacuum Gauges are most suitable for UltraHigh Vacuum; Gauges are gas type dependent UltraHigh Vacuum Pumps: (Sputter Ion, Getter, Titanium Sublimation) complement a UHV System s High Vacuum Pumps (TurboMolecular, Cryo, LN2, Vapor Jet/Diffusion)

Summary: UltraHigh Vacuum Molecular Flow requires pumps with high conductance inlets mounted as close as possible to the vacuum system Modified Ionization Vacuum Gauges are most suitable for UltraHigh Vacuum; Gauges are gas type dependent UltraHigh Vacuum Pumps: (Sputter Ion, Getter, Titanium Sublimation) complement a UHV System s High Vacuum Pumps (TurboMolecular, Cryo, LN2, Vapor Jet/Diffusion) In UltraHigh Vacuum, OUTGASSING (Desorption and Diffusion must be managed: Bakeout ESSENTIAL for achieving UHV pressures

Summary: UltraHigh Vacuum Molecular Flow requires pumps with high conductance inlets mounted as close as possible to the vacuum system Modified Ionization Vacuum Gauges are most suitable for UltraHigh Vacuum; Gauges are gas type dependent UltraHigh Vacuum Pumps: (Sputter Ion, Getter, Titanium Sublimation) complement a UHV System s High Vacuum Pumps (TurboMolecular, Cryo, LN2, Vapor Jet/Diffusion) In UltraHigh Vacuum, OUTGASSING (Desorption and Diffusion must be managed: Bakeout ESSENTIAL for achieving UHV pressures Materials Selection (permeation & bakeability ) and Backstreaming must be dealt with to achieve lowest ultimate pressure

Summary: UltraHigh Vacuum Molecular Flow requires pumps with high conductance inlets mounted as close as possible to the vacuum system Modified Ionization Vacuum Gauges are most suitable for UltraHigh Vacuum; Gauges are gas type dependent UltraHigh Vacuum Pumps: (Sputter Ion, Getter, Titanium Sublimation) complement a UHV System s High Vacuum Pumps (TurboMolecular, Cryo, LN2, Vapor Jet/Diffusion) In UltraHigh Vacuum, OUTGASSING (Desorption and Diffusion must be managed: Bakeout ESSENTIAL for achieving UHV pressures Materials Selection (permeation & bakeability ) and Backstreaming must be dealt with to achieve lowest ultimate pressure Techniques for troubleshooting HIGH VACUUM applications include Pumpdown Curves, RateofRise Tests and Helium Mass Spec Leak Detection

Vacuum Education Programs For Information on Agilent s Vacuum Technology Products and Services, please email vplcustomercare@agilent.com or call 800882 7426, and select option 3. To learn about more Agilent Vacuum Technology Education programs, including UHV Seminars at your institution Scheduled multiday classes in Vacuum Practice and Leak Detection Custom multiday classes at your site Other custom training classes to fit your needs Please email Robin Arons (robin.arons@agilent.com), or call Customer Care at 8008827426 (Option 3) for more details on these programs Confidentiality Label April 3, 2017 64