APPLICATION NOTE. This application note will summarize the power and thermal cycling capability of eupec high power IGBT modules.

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APPLICATION NOTE Date:2003-07 Page 1 of 5 AN-Number: AN2003-x04 This application note will summarize the power and thermal cycling capability of eupec high power IGBT modules. Standard modules are designed for the needs of general industrial applications while feature specific measures for increased reliability. They are fulfilling even the severest specifications commonly required by traction or industrial applications with heavy load cycles. Traction modules are available in the voltage classes from 1700V up to 6500V. T junction T DCB temperature [ C] T case T cooler Si chip DCB t [s] The power cycling capability, given by the temperature excursions of the junction, depicts the quality of the bond wires while the thermal cycling capability specifies the material matching between base plate and substrate in regard to their capability to sustain thermal stress. For more details on this, see the PCIM 2002 paper The new 6.5kV IGBT module: a reliable device for medium voltage applications, available on eupec s hompage (editorials). eupec GmbH Max-Planck-Straße 5 D-59581 Warstein Author: Thomas Schütze Tel. +49(0)2902 764-1153 Fax +49(0)2902 764-1150 Email: thomas.schuetze@eupec.com www.eupec.com

Page 2 of 5 The power cycling diagram Tests are performed by temperature swings which commonly reach a T jmax of 125 C (e.g. the value for T j = 40K is derived from cycles between 85 C and 125 C). Failure indicator is an increase of the forward voltage by 5%. With this, the parameters are still within the limits of the data sheet and the switching characteristics are within the specification! Power cycling capability of standard and at 125 C Against formerly published diagrams, the standard curve is now extended widely into the direction of lower T j. Actual measurements confirm 200Mio. cycles at 19K. The above failure criteria was still not reached when stopping the test due to material fatigue in the test stand. Considering the gain of reliabilty between standard and traction technology, predictions into the range of low temperature excursions at high number of cycles could be done for as well. These values are marked as estimated in the above diagram.

Page 3 of 5 For applications which do not reach the temperature level of 125 C, the diagram only allows a worst case estimation. To allow also calculations for temperatures below this level, a second set of measurements was performed, now testing temperature swings starting at a T jmin of 25 C. Tjmin = 25 C Power cycling of in dependency of the temperature Tjmin = 25 C Power cycling of in dependency of the temperature

Page 4 of 5 Further temperature levels in-between the range of T jmin =25 C and T jmax =125 C can be evaluated with the help of acceleration factors: Acceleration Factor 10 1 0 20 40 60 80 Change of Temperature Level Example: what is the power cycling capability of a traction module for repetitive cycles of T j = 50K from T jmin = 50 C to T jmax = C? Acceleration factors for power cycling The power cycling diagram for in combination with above accelating factors give the following numbers: 0.95Mio cycles for T j = 50K and T jmax = 125 C operation at C instead of 125 C (-25K) gives a deceleration by a factor of approximately two, resulting in 1.9Mio cycles. 4.7Mio cycles for T j = 50K and T jmin = 25 C operation at 50 C instead of 25 C (+25K) gives an acceleration by a factor of 2 resulting in 2.35Mio cycles. Interpolation between the two results finally allows a prediction of roughly 2.1Mio cycles. 125 C 950.000 75 C 75 C Interpolation in between the two curves C -25 C -> factor 2 0.95 Mio. Cycles @ 125 C / 50K -> 1.9 Mio. Cycles -> roughly 2.1 Mio. cycles 4.700.000 25 C 50 C +25 C -> factor 1/2 4.7 Mio. Cycles @ 25 C / 50K -> 2.35 Mio. Cycles

The thermal cycling diagram Thermal cycling means driving the case (base plate) at two different case temperatures, e.g. testpoints: T c = 80K: T c1 = 20 C T c2 = C Failure indicator is an increase of the thermal resistance of 20%. With this, the parameters are still within the limits of the data sheet and the switching characteristics are within the specification! The improvements, receivable by changing the base plate material from Cu (standard) to AlSiC (traction), are documented in the following figure. Page 5 of 5 10.000.000 --- estimated curve 1.000.000.000 10.000 standard (Cu) traction (AlSIC) 1.000 30 40 50 60 70 80 90 delta Tc in K Thermal cycling capability for standard (Cu) and traction (AlSiC) modules The thermal cycling capability can be substantially increased, whereby Al- SiC shows absolutely no indications of delamination or weakening of the solder structure. Example for standard and : standard traction e.g...r17ke3 e.g...r17ke3_b2 Baseplate copper AlSiC Chip bonding standard bond process special coating Reliability standard very high Insulation Al 2 0 3 AlN