Notes-PECVD: Chamber 1

Similar documents
Plasma-Therm PECVD. Operating Characteristics. Operating Instructions. Typical Processes. I. Loading. II. Operating

STS PECVD Instructions

Standard Operating Manual

Arizona State University Center for Solid State Electronic Research. Table of Contents. Issue: C Title: Oxford Plasmalab 80plus (Floey) Page 1 of 8

Unaxis ICP/RIE SOP Revision 8 09/30/16 Page 1 of 5. NRF Unaxis ICP/RIE Etch SOP

Unaxis PECVD. SiH4 (5% in He)

PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION (PECVD) SOP OXFORD PLASMALAB SYSTEM 100

March CS-1701F Reactive Ion Etcher

STS ICP-RIE. Scott Munro (2-4826,

OXFORD PLASMALAB 80PLUS (CLOEY)

University of Minnesota, MN Nano Center Standard Operating Procedure

Basic ICP Operating Procedures

Trion PECVD SOP IMPORTANT: NO PLASTIC, TAPE, RESISTS, OR THERMAL PASTE ARE ALLOWED IN THE CHAMBER

Arizona State University NanoFab PLASMATHERM 790 RIE. Version A

NORDSON MARCH PX-1000 PLASMA ASHER STANDARD OPERATING PROCEDURE Version: 1.0 July 2016

University of MN, Minnesota Nano Center Standard Operating Procedure

Operating Procedures for the. SAMCO ICP RIE System

5.1.3 Mechanical Hazards Drive assemblies have sufficient power to cause injury. Keep hands, fingers, clothing and tools clear of moving parts.

R I T. Title: STS ASE Semiconductor & Microsystems Fabrication Laboratory Revision: Original Rev Date: 01/21/ SCOPE 2 REFERENCE DOCUMENTS

Usage Policies Notebook for Trion RIE / ICP Dry Etch

University of MN, Minnesota Nano Center Standard Operating Procedure

Nanofabrication Facility: ECR Etcher SOP Rev. 01b, March 06. Standard Operating Procedure for PlasmaQuest ECR II Etching

Usage Policies Notebook for Xenon Difluoride (XeF 2 ) Isotropic Si Etch

Plasma Asher: March PX-500 User guide (May-30, 2017)

Standard Operating Manual

Standard Operating Manual

Standard Operating Manual

Usage Policies Notebook for STS DRIE System

Standard Operating Manual

Standard Operating Manual

Nanofabrication Facility: PECVD SOP Rev. 00, April 24

SSI Solaris 150 RTA Revision /27/2016 Page 1 of 9. SSI Solaris 150 RTA

Xactix XeF2 OPERATION MANUAL

STS DRIE User SOP Location: NRF Cleanroon, Dry Etch Bay

March Asher Operation

Edge Isolation Tool. Standard Operating Procedure. Version 1.1. Date: Prepared by, Sandeep S S. Department of Electrical Engineering

Xactix Xenon Difluoride Etcher

Usage Policies Notebook for NanoFurnace Furnace (EasyTube 3000 System)

Unifilm Technology PVD-300 Sputter Deposition Operation Instructions

Leaks, contamination and closed loop control how RGAs make coating processes more profitable

JETFIRST 150 RTA SYSTEM OPERATING MANUAL Version: 2 Feb 2012

SINGULUS TECHNOLOGIES

Issue: H Title: CHA E-Beam Evaporator Page 1 of 7. Table of Contents

1.1 Equipment: substrate, wafer tweezers, metal targets 1.2 Personal Protective Equipment: nitrile gloves, safety glasses 1.

Arizona State University NanoFab XACTIX ETCHER. Rev A

University of Minnesota Nano Fabrication Center Standard Operating Procedure

Title: Xactix XeF2 Etcher Semiconductor & Microsystems Fabrication Laboratory Revision: A Rev Date: 03/23/2016

Standard Operating Procedure. For. PVD E-Beam

MJB4 Mask Aligner Operating Procedure. Effective Date: 07/12/2012 Author(s): Jiong Hua Phone:

The MRL Furnaces USED FOR THIS MANUAL COVERS

MANUAL FOR SPTS APS (DIELECTRICS ETCHER)

Plasma 1 (Technics) Standard Operating Procedure. Revision: 1.0 Last Updated: Feb.5/2013, Revised by Grace Li

Savannah S100 ALD at SCIF, UC Merced Standard operating Procedure

University of MN, Minnesota Nano Center Standard Operating Procedure

Cambridge NanoTech: Savannah S100. Table of Contents

Plasma II (AXIC) Standard Operating Procedure. Revision: 1.0 Last Updated: Feb.6/2013, Revised by Grace Li

BEST KNOWN METHODS. Transpector XPR3 Gas Analysis System. 1 of 6 DESCRIPTION XPR3 APPLICATIONS PHYSICAL INSTALLATION

Cryo-Evaporator Operation

RAPID THERMAL PROCESSOR (Annealsys AS-ONE 150) Lab Manual

Plasma Cleaner. Yamato Scientific America. Contents. Innovating Science for Over 125 Years. Gas Plasma Dry Cleaner PDC200/210/510 PDC610G.

Nordiko Metal Sputtering System Standard Operating Procedure

UNIVERSITY OF ROCHESTER MEDICAL CENTER

Usage Policies Notebook for AMST Molecular Vapor Deposition System MVD 100

Operating Procedures for Metal Evaporator I

NNCI ETCH WORKSHOP SI DRIE IN PLASMATHERM DEEP SILICON ETCHER. Usha Raghuram Stanford Nanofabrication Facility Stanford, CA May 25, 2016

Standard Operating Manual

1)! DO NOT PROCEED BEYOND THIS MARK

Revised: June 7, 2017

Usage Policies Notebook for Thermco Atmospheric Diffusion Furnace system

Chapter 2 General description of the system

Application Note. ASTRON Remote Plasma Source Ignition Best Practices PROBLEM

Approved by Principal Investigator Date: Approved by Super User: Date:

Warnings: Notes: Revised: October 5, 2015

Angstrom Dielectric Sputterer Operation Manual

KEM Scientific, Inc. Instruments for Science from Scientists

Equipment Standard Operating Procedure Greg Allion and Kimberly Appel

Standard Operating Procedure

Equipment Operating Procedure Glove Box

Indian Institute of Technology Kanpur Samtel Centre for Display Technologies

Usage Policies Notebook for BMR HIDEP Low Temperature Plasma Enhanced CVD (LTPECVD)

Napa Technology Trouble Shooting. For Premier & Premier PLUS Models

Superconducting Susceptometer (MPMS-5S) Quantum Design Room 296 (MPMS)

INSTALLATION,OPERATION AND MAINTENANCE INSTRUCTIONS DRY AIR COOLER

STS Advanced Oxide Etch DRIE System Trends

NorthStar ALD Operation Manual

In Response to a Planned Power Outage: PPMS EverCool II Shut Down and Re-start Procedure

Varian 3300 Gas Chromatograph Abbreviated Operating Instructions

CHEMICAL ENGINEERING SENIOR LABORATORY CHEG Initiated Chemical Vapor Deposition

Oerlikon Sputtering Evaporator SOP

Reflow Oven HHL3000 INSTRUCTION MANUAL POHUA - jedyny autoryzowany przedstawiciel w Polsce

Usage Policies Notebook for Karl Suss MA6 Mid / Deep UV Mask Aligner

Thermo K-Alpha XPS Standard Operating Procedure

Basic & Controlled Atmosphere Glove Boxes

LESKER #1 STANDARD OPERATION PROCEDURE

AX5000 Operational Manual

Operation of the mask aligner MJB-55

Race Screen: Figure 2: Race Screen. Figure 3: Race Screen with Top Bulb Lock

COMELEC C-30-S Parylene Coating System

Standard Operating Procedure #COE-SOP-0001 Chemical Fume Hood Operation

ICP- CVD Inductively Coupled Plasma - Chemical Vapor Deposition

Transcription:

plasmatherm (EML) STANDARD OPERATING PROCEDURE CORAL Name: Plasmatherm Model Shuttlelock System VII SLR-770/734 Number: Location: EML What it Deposits the following films via Plasma-Enhanced Chemical Vapor Deposition (PECVD): does: Amorphous silicon Silicon dioxide Silicon Nitride Removes the same films, as well as metals and photoresist, via Reactive Ion Etching (RIE) Safety: 1. In case of emergency, hit the large RED button on the left side of the Plasmatherm and then notify staff. 2. This machine requires several sequences, like venting, stabilizing an MFC or reflected RF power, or pump-down, to be reached within a limited time period, which may be exceeded, causing a machine error to flash on the CRT. 3. Push the "hold" button to clear this error message, and make required adjustments. 4. Never reset (by pressing the Hold button) the reflected power more than twice, as damage to the machine may result. 5. Always wear gloves in EML; put new pair on before touching inside the chamber. Generally keep the loadlock closed, open only briefly: moisture or dust will drastically increase your pump-down times and alter results. 6. Select the turbo pump as "default pump" for RIE (right chamber), and the low pressure pump (no turbo) as default pump for the PECVD (left chamber). 7. All Toxics and flammables must be labeled "OPEN" when in use. The cylinders are "CLOSED" by MTL Staff in the evening and reopened in the morning. Procedure: Pre-run checklist: 1. Engage the machine in CORAL to remove the Gas Panel Off interlock fault. 2. Inspect the handle wafer. If contaminated, discard that wafer in the sharps container and choose another one from the cassette box on top of the system controller (the cabinet with the CRT) 3. This wafer should be coated in a test run of whatever PECVD process you plan to run. If you plan to run an RIE process, the handle wafer must not have the same surface exposed that you are trying to remove. For example, if you plan to do an RIE process to etch silicon, the handle wafer must have a coating of either oxide or nitride. The silicon cannot be exposed to the plasma, or the etch rate will suffer. Notes-PECVD: Chamber 1 Before running your devices, you should do a 5 or 10 min dummy run of the film you plan to deposit without any samples present (only the handle wafer) prior to your actual run. This is to condition the chamber. When done w/ PECVD, you must do a chamber clean. Look for the Chamber Clean disk. This recipe is comprised of a 20 min CF4/O2 process followed by an 8 min N2 plasma as a defluorination step. You MUST ensure the chamber is clean before leaving! This is only fair to the users that come after you. Notes-RIE: Chamber 2

A. Before starting an RIE run, look at the most recent RIE user's run sheet to determine what chemistry they were Using. If their process was different from yours, you should do a 5 or 10 min dummy run with your chemistry without any samples present prior to your actual run. This is to reduce the contamination from their process onto yours. If their process was similar to yours, you don't need a conditioning run. If you use Ar and Cl, you may use the Alumina susceptor in the acrylic box instead. B. Helium Cooling of RIE Substrate This tool has the capability of cooling the substrate during RIE runs. This is especially important with longer run times when resist can get damaged due to excessive heating. The Helium Cooling Panel is located below the RIE chamber, at knee level. The Helium Cooling capability is manually operated, and not automatic. Labels tell you which switch to turn On during the Process Steps of the recipe (as opposed to the Pumpdown, Purge and Evacuation Steps.) Helium flows at 4 sccm (displayed on the left readout). The pressure should be in the range of 2-5 Torr (displayed on the right readout). Operating Procedure: 1 Startup Check active chamber in CRT, which will be highlighted by a white bar. Left Chamber=PECVD, Chamber 1. Right Chamber=RIE, Chamber 2. If a process has been completed, the Ready and OnLine lights will be lit. To change to the other chamber: Press in this order: Standby On (you'll hear a loud pneumatic release) Menu On the Tool Screen, Select Active Chamber, Use the arrow key to select PECVD (Ch 1) or RIE (Ch 2) Screen will display Chamber 1 or 2 is selected. It may also display Recipe is not for selected chamber. If this is displayed, you will need to load your program. See Section 3 below. The chamber may need to be pumped down. If so, press in this order: Ready Menu Select "Pump Chamber" Select "Low Vacuum Pump" for CVD or "Turbo" for RIE Check Loadlock Process indicator. If not at atmosphere press Vent 2 Loading a Recipe From Disk and Reviewing It

Once pumped down, insert the disk with your desired recipe into the floppy drive. Press in this order: Standby Program The security code is 3333 Choose Load from the options displayed. To review the recipe, press Review. Use the down arrows to step through it. The expected values for the Basic Recipes are shown in the Appendix. After reviewing the last step, press Ent. Note: If the disk fails to read, in other words, if the green floppy drive light stays on for more than 60 seconds, see the Troubleshooting Section. 3 Editing a Recipe The steps below pertain to Editing an existing recipe. To create a new recipe, or learn more about how recipes are constructed, see Section 6 Creating a Recipe Press Standby Press Program Enter the security code: 3333 The options displayed are: Build Edit Load Save Review Exit Select Load to load the recipe from the disk. It takes a few seconds to read the disk. Select Edit to review the recipe. The recipe steps will display as a list. The options displayed are: Program Flow Edit Step Insert Step Delete Step Exit Select Program Flow. Use the Up Arrow and Down Arrow to move up and down the recipe to select the step(s) you want to edit. When pointing at the desired step, press the ENT button then select Edit Step You can make changes to: Gases used Gas flow rates Pressure RF power On/Off RF Power level Step Time Once changes are made, select Exit To Insert a Step:

Place the cursor below the desired insertion point. You can insert the following types of steps: Process Purge Evacuation Pumpdown Unload Load To save the changes to the floppy disk: Make sure the Write-Protect switch on the floppy disk is Off (You can see through the little box if Write Protect is Off. If the window is blocked, then the Write Protect is On.) Select Save Select Exit 4 To Run a Process To run, press Ready, then Run. Online should already be lit. Be sure to fill in the Process Logbook completely. If the process fails to run automatically, see the Troubleshooting Section. RIE Processes: Remember to turn On the helium cooling circuit at the start of the Process Steps, and Off when the Process Steps end. 5 Completing a Recipe, Securing the Tool: After finishing processing, including test runs and Chamber Cleans, simply unload your samples and latch the Load Lock. Remember to run a Chamber Clean on the PECVD chamber. There is no chamber clean for the RIE chamber. The loadlock usually sits at atmosphere when the tool is Idle. 6 Creating a Recipe Background A typical recipe sequence for either chamber may be: Choose the process temperature* Load the wafer into the chamber Optionally allow time for the sample to reach temperature after loading Purge the chamber Evacuate chamber to base pressure Flow process gases without RF for 1 min, to allow system environment to stabilize Flow process gases with RF on, the actual process step Unload, optionally pump to base pressure Optionally Evacuate the chamber Optionally Purge the chamber End step, including turbo chamber pump-out. Do not clean out the lines, do vent at the end

* Only the PECVD chamber can control to a temperature, in the range of 150-300C. Climbing to 300C is very slow, on the order of 1 hr. Idle temperature is 200C. The RIE chamber allows for selection of a substrate temperature, but in fact there is no heating capability. When creating an RIE recipe, set the temperature to 200C to avoid having to needlessly wait for the temperature to change in the PECVD chamber, which will have absolutely no bearing on your RIE process. Example This example is an RIE Oxide Etch program, which is similar to etch programs in sequence, but not in chemicals or flow-rates. A small amount (~3 sccm) of CF4 (HC-14, RIE gas #6 ) for SiO2 removal, can be used in addition to O2 (~30 sccm, RIE gas #5), but may not be needed. If you want to process at a pressure lower than 30mT, you may have to add a step to strike a plasma at 30+ mt, w/ a 1min termination time, followed by your actual process step with the lower pressure desired. Press Standby & Program Select Build o Initial Data Step # 00 (basic parameters, chamber pump-out) Program Build Chamber #2 Program Number: Enter any single digit Temperature: 200C (see comments in Background section, above) Default Pump: Turbo Initial Pump down Pump: Turbo Base Pressure (torr): (1x10-4 or 5x10-5) Hold After Base Pressure: Optional, normally Not Required o Purge Step #1: no RF (30 sec-1 minute) o Evacuate Step #2: (30 sec-1 minute) o Process Step #03 (to flush gas lines, chamber) Ch 5 sccm: 30 (Gas O2) Ch 6 sccm: 3 (Gas CF4) Pressure (mt): 30 Process Pump: Turbo RF Generator Used: None Termination Time: (30sec-1 min) o Process Step #04 (Etch Step) Gases Ch 5 & 6, Pressure & Turbo same as Step # 01, RF Generator Used: RF1 RF Configuration: RIE (for etch, PE for PECVD) RF Controlled by: INCP (incident power) RF1 set point (watts): 100 (Note: 300W is the Maximum) Termination Time: Varies o Evacuation #05 (chamber pump-out) Evacuation Time: (30 sec-1 min) o Purge #06 (N 2 Purge to flush chamber) Purge Type: Normal Time: (30 sec-1 min) o Unload #7 Pump to base pressure after Unload? No Base pressure (torr): 1x10-4

Hold after base pressure? No o End Sequence #8 Gas Line Cleanup: None Unload Wafer: Yes Final Pump: Turbo Base pressure (torr): 1x10-4 Hold after Base Pressure? No Vent Lock after Process? Yes You may need to edit a step caused by a miss-type (sorry about the sticky keys!), and always review a program when done. To edit: o o o Program Flow. Use the arrows to go to the step which needs editing, then hit "yes" and choose Edit. Follow prompts If you need to insert additional steps, select the step below the insertion point, then select Add Step Variations for PECVD Pressures are typically between 200 and 900mT. The turbo is not available. The default plate temperature set point is 200C, appropriate for most work, which will be targeted when you turn on the heating element, the white breaker on the lower-left of the machine. If you want to run at higher temperature, like 300C, which can yield slightly better films, but with different deposition rates, your program will not target the higher temperature until it the recipe started. If so, include a long Hold After Base Pressure time, maybe 60 minutes, in the program to allow the correct temperature to be reached before starting. To cool to 150C, set a Hold After Base Pressure time of 20 min. Appendix Table of Basic Recipes The recipes below are shown for reference. Run conditions may be modified temporarily for specific applications, but DO NOT OVERWRITE THE BASIC RECIPES STORED ON DISK. If you would like a disk for your specific process, just ask for one. Note 1: Always perform a test run to determine the current deposition rate. This run can double as the chamber conditioning run as described in the Pre-Run Checklist section. Note: 2: As stated in the Pre-Run Checklist section, you must run a Chamber Clean when you finish Using this tool. PECVD Processes: SiO2 Deposition. Typical Refractive Index: 1.46 in March 2012

150 sccm SiH4 600 sccm N2O Pressure, mt 500 Temperature, C 250 RF Power, W 25 Nominal Deposition Rate, 5 Run Time, min 10 Purple Silicon Nitride Deposition. Typical Refractive Index: 2.01 in March 2012 3 sccm NH3 100 sccm SiH4 600 sccm N2 Pressure, mt 500 Temperature, C 250 RF Power, W 20 Nominal Deposition Rate, 8 Run Time, min 10 a-si Deposition 150 sccm SiH4 Pressure, mt 500 Temperature, C 150 RF Power, W 25 Nominal Deposition Rate, 5 Run Time, min 10 PECVD Chamber Clean 100 sccm CF4/O2 (20 min)

100 sccm N2 (8 min) Pressure, mt 50 Temperature, C 200 RF Power, W 100 Nominal Deposition Rate, N/A Run Time, min 20+8 Purple, then red RIE Processes: Note: As stated in the Pre-Run Checklist section, you must run a Chamber Conditioning Run before Using this tool. Descum 35 sccm O2 Pressure, mt 95 RF Power, W 100 Nominal Etch Rate,?? Purple Oxide Etch, Low Power 3 sccm O2 30 sccm CF4 Pressure, mt 30 RF Power, W 100 Nominal Etch Rate, 26 Light blue Oxide Etch, High Power

3 sccm O2 30 sccm CF4 Pressure, mt 30 RF Power, W 200 Nominal Etch Rate, 74 * 200C is programmed as the substrate temperature, even though temperature control does not exist for RIE. See Section 7, Creating a Recipe, Background, for an explanation. Silicon Etch 3 sccm O2 30 sccm SF6 Pressure, mt 40 RF Power, W 200 Nominal Etch Rate, 0.6 um/min Metals, Si Etch-1 (also known as Break Through Etch) 30 sccm BCL3 Pressure, mt 30 RF Power, W 200 Nominal Etch Rate, 30 Si

Metals, Si Etch-2 (also known as Speed Etch) 20 sccm CL2 20 sccm BCL3 Pressure, mt 30 RF Power, W 200 Nominal Etch Rate, XX Si * 200C is programmed as the substrate temperature, even though temperature control does not exist for RIE. See Section 7, Creating a Recipe, Background, for an explanation. Non-Volatile Etch (for Ni, au, Pt, Pyrex, etc) 10 sccm CL2 10 sccm BCL3 10 sccm Ar Pressure, mt 30 RF Power, W 300 Nominal Etch Rate, XX Si Whitish gray * 200C is programmed as the substrate temperature, even though temperature control does not exist for RIE. See Section 7, Creating a Recipe, Background, for an explanation. Troubleshooting Below is a list of common errors seen while Using the Plasmatherm, and suggested solutions to these problems.

Problem Solution Comment Wafer fails to Load or Unload and alarm sounds Pressing the Hold button once or twice will load the wafer and clear the alarm. You will see the Alarm light flash Red and hear a repeating beep. A comment will appear on the screen saying: Sequencer Error Detected Arm cannot get into chamber position or Arm cannot get into home position. RF Reflected Power High System is frozen Pressing Hold will restart the RF Power Supply. Note: Reflected Power is most often at its highest level when first running a test run or process. Here it may take 3 times to get the Reflected Power to pass. If Reflected Power goes high in the middle of a run after being stable at the start, you need to pause 10 min to let the RF power supply cool down. Reset system by pressing the RESET button. This is behind a door at about waist-level on the system controller (the tower housing the CRT) Usually seen when 300 Watts of RF power or more is selected. You may need to restart the turbopump after resetting the tool. To do this: Press in this order: -On (you ll hear a loud pneumatic release) -Menu -Power Up High Vacuum Pump

-Turbopump On Troubleshooting, cont d Problem Solution Comment Recipe fails to Load from disk. Do the following: Eject the disk Disk drive appears to Reset the tool Using freeze with green the Reset light on. button. (SEE A STAFF MEMBER) After resetting the tool, you may need to restart the turbo. Do this if the green light is NOT lit on the gray turbopump controller. To restart the turbopump, Press in this order: Particles on the wafer after PECVD dep On (you ll hear a loud pneumatic release) Menu Power Up High Vacuum Pump Turbopump On Notify a staff member. This requires venting and manually cleaning the deposition chamber. Following the manual clean, do a: 20 min Chamber Clean and inspect 10 min SiO2 dep and inspect Author: Gary Riggott, 9/12